1995 • Proceedings of ALTECH 95, vol. 95-30, pp. 73-82

New Surface Photovoltage (SPV) Method for High Precision Measurement of the Minority Carrier Diffusion Length and Surface Recombination Velocity in Silicon Wafers

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surface photovoltageMinority Carrier Diffusion Lengthsurface recombination velocitySilicon (Si)

V. Faifer, P. Edelman, A. Kontkiewicz, J. Lagowski, A. Hoff, V. Dyukov, A. Pravdivtsev, I. Kornienko

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