전력 장치 특성화를 위한 분석 도구
저자: H-J. Schulze, A. Frohnmeyer, F-J. Niedernostheide, B. Simmnacher, B.O. Kolbesen, P. Tüttő, T. Pavelka, G. Wachutka
주제: transition metals; contamination; carrier lifetime; silicon defect density

The DLS-1200 is a state-of-the art sensitivity Semilab Deep Level Transient Spectroscopic device, designed for the wafer & EPI manufacturers, IC fabs and research institutes due to recent hardware and software improvements.
Equipped with different cryostats, DLS-1200 detects and identifies electrically active impurities over wide temperature ranges on semiconductor samples. The new DLS-1200 provides the same top-tier sensitivity, low-noise and full automation, and now comes with the previously optional TAS included as a standard.
Semilab DLS-1200 is the successor of the DLS-1100 system, therefore DLS-1100 will be discontinued with the release of DLS-1200.
DLS-1200 Deep Level Transient Spectroscopy
저자: H-J. Schulze, A. Frohnmeyer, F-J. Niedernostheide, B. Simmnacher, B.O. Kolbesen, P. Tüttő, T. Pavelka, G. Wachutka
주제: transition metals; contamination; carrier lifetime; silicon defect density
저자: L. Quattropani, K. Solt, P. Niedermann, I. Maggio-Aprile, O. Fischer, T. Pavelka
주제: Schottky diode; RF plasma treated silicon
저자: C.A. Londos, T. Pavelka
주제: DLTS; GaAs
저자: D.A. Ramappa, W.B. Henley
주제: diffusion; iron; silicon dioxide
저자: Homogeneous Transparent Conductive ZnO:Ga by ALD for Large LED Wafers
주제: GZO; Atomic layer deposition; TCO; Rapid thermal annealing; LED
저자: T. Pavelka and G. Ferenczi
주제: Thermal emission; deep trap
저자: B. Sandhu, T. Ogikubo, H. Goto, V. Csapó, T. Pavelka
주제: DLTS; SIRM; Silicon (Si); Mo; Fe; deep levels; carrier lifetime
저자: A. Bertuch, K. Steeples
주제: NIST traceable; surface photovoltage; standard; reference wafer; Electric measurements; Electrical resistivity; Metrology; Epitaxy; Silicon (Si)
저자: Zsolt Kovács, Csanád Ö. Boros, Teodóra N. Kovács, Zsolt Kovács, ZoltánT. Kiss
주제: optical inspection; Silicon (Si); POLARIZED INFRARED IMAGING; VISUAL INSPECTION
저자: T. Pavelka and B. Hemm
주제: Microwave Absorption Spectroscopy
저자: O. Engström, M.Kaniewska, W.Jung, M.Kaczmarczyk
주제: Deep level transient spectroscopy; quantum dots; tunneling; conduction bands; electric field
DLS-1200 Deep Level Transient Spectroscopy