박막 측정을 위한 새로운 전처리 방법
간행물 읽기
제품 정보 및 가격 문의
연구 요구에 맞춘 전문가 상담과 맞춤형 솔루션을 받아보세요
• 파장 범위: 380nm~1000nm(추가 비용으로 파장 확장 가능)
• 수동 고니오미터: 60°~90°
• 조정 단계: 60°~75° 구간에서 5°(더 넓은 범위는 요청 시 추가 비용으로 제공)
• 조정 가능한 빔 직경: 최대 5mm(Microspot은 기본적으로 포함되지 않으며 옵션으로 제공)
• 고정식 시료 스테이지: 최대 직경 200mm 시료
SE-1000 분광 타원편광법
저자: Lenke Kócs, Borbála Tegze, Emőke Albert, Csaba Major, András Szalai, Bálint Fodor, Péter Basa, György Sáfrán, Zoltán Hórvölgyi
주제: porous silica coatings; spectroscopic ellipsometry; ELLIPSOMETRIC POROSIMETRY; mesoporous; anti-reflective coatings
저자: Baekmin Q. Kim1†, Zachariah Vicars1†, Máté Füredi2,3, Lilia F. Escobedo1, R. Bharath Venkatesh1‡, Stefan Guldin2,4,5, Amish J. Patel1*, Daeyeon Lee1
주제: spectroscopic ellipsometry
저자: P. Basa, B. Fodor, Zs. Nagy, B. Oyunbolor, A. Hajtman, S. Bordács, I. Kézsmárki, A. Halbritter, Á. Orbán
주제: ellipsometry; rotating compensator; mueller matrix; spectroscopic ellipsometer
저자: D. Le Cunff, T. Nguyen, R. Duru, F. Abbate, J. Hoglund, N. Laurent, F. Pernot, M. Wormington
주제: Ge-Si alloys; boron; elemental semiconductors; semiconductor doping; semiconductor epitaxial layers
저자: Máté Füredi, Cristina V. Manzano, András Marton, Bálint Fodor, Alberto Alvarez-Fernandez,*
주제: EP
저자: Maximiliano Jesus Jara Fornerod, Alberto Alvarez-Fernandez, Máté Füredi, Anandapadmanabhan A Rajendran, Beatriz Prieto-Simón, Nicolas H. Voelcker, Stefan Guldin
주제: spectroscopic ellipsometry
저자: Zs.J. Horváth, P. Basa, T. Jászi, K.Z. Molnár, A.E. Pap, Gy. Molnár
저자: A. Danel, C.L. Tsai, K. Shanmugasundaram, F. Tardif, E. Kamieniecki, J. Ruzyllo
주제: Lamp cleaning; Organic contamination; Volatile contaminants; hydrocarbons
저자: Balogh Imre, Kiss Roberta Zsófia, Egri Dávid
주제: spectroscopic ellipsometry
저자: C. Talagrand, X. Boddaert, D.G. Selmeczi, C. Defranoux, P. Collot
주제: InGaZnO; spectroscopic ellipsometry; Dielectric function; Process deposition; Amorphous semiconductor
저자: Dmitriy Marinskiy, Patrick Polakowski, Piotr Edelman, Marshall Wilson, Jacek Lagowski, Joachim Metzger, Robert Binder, Johannes Müller
주제: corona - Kelvin; noncontact metrology; surface voltage; THIN FILM CHARACTERIZATION; ferroelectric; HfO2
저자: Homogeneous Transparent Conductive ZnO:Ga by ALD for Large LED Wafers
주제: GZO; Atomic layer deposition; TCO; Rapid thermal annealing; LED
저자: O. Mhibik, S. Ch´enais, S. Forget, Ch. Defranoux, S. Sanaur
주제: vertically-emitting solid-state organic lasers (VECSOLs); inkjet printing; new host polymer matrix for standard laser dyes; Tunable laser
저자: G. Szitási, F. Korsós, D. Selmeczi, O. Takács, F. Novinics, P. Tüttő, A. Findlay, M. Wilson
주제: eddy current testing; ellipsometry; fluorine; photoconducting materials; photovoltaic effects; spectroscopy; tin compounds
저자: Máté Füredi, Bálint Fodor, András Marton, Alberto Alvarez-Fernandez, Aysha ARiaz, Curran Kalha, Anna Regoutz, Stefan Guldin, Péter Basa
주제: Ellipsometers; ellipsometry; ellipsometry porosimetry; ELLIPSOMETRIC POROSIMETRY; ELLIPSOMETRIC POROSIMETRY (R&D); Mesoporous silica films; Porosimetry; mesoporous
저자: Emeric Balogh, Peter Basa, Attila Suto, Benjamin Powell, Anna Bölcskei-Molnár, and Szilvia Biró
주제: ellipsometry; spectroscopic ellipsometry
저자: Akshay Singh, Yifei Li, Balint Fodor, Laszlo Makai, Jian Zhou, Haowei Xu, Austin Akey, Ju Li and R. Jaramillo
주제: ellipsometry; visible spectra; Transmission electron microscopy; Density functional theory; Photonic integrated circuits; Transition metal chalcogenides; Optical metrology; Crystalline solids; Optical electronics
저자: J. Budai, B. Farkas, Z.L. Horváth, Zs. Geretovszky
주제: ellipsometry; modelling; Artifact minimization; Numerical inversion
저자: Máté Füredi, Alberto Alvarez-Fernandez, Maximiliano Jesus Jara Fornerod, Bálint Fodor, and Stefan Guldin
주제: spectroscopic ellipsometry; EP
저자: A.A. Khosroabadi, P. Gangopadhyay, B. Cocilovo, L. Makai, P. Basa, B. Duong, J. Thomas, and R.A. Norwood
주제: spectroscopic ellipsometry
저자: László Makai, Benjamin Kalas, György Tiborcz
주제: Ellipsometers; ellipsometry; Interfaces; spectroscopic ellipsometry; Surface; Surface measurement
저자: Adam J. Lovett*, Máté Füredi, Liam Bird, Samia Said, Brandon Frost, Paul R. Shearing, Stefan Guldin, Thomas S. Miller*
주제: spectroscopic ellipsometry
저자: K. Wang, B. Cheng, B. Wu, C. Defranoux, P. Basa, C. Song, G. Han, Y. Liu
주제: spectroscopic ellipsometry; Fluorinated tin oxide; Low emissivity; annealing
저자: Aysha A. Riaz, Curran Kalha Maria Basso, Máté Füredi, Anna Regoutz
주제: spectroscopic ellipsometry
저자: Jialin Gu; Adam J. Lovett; Máté Füredi; Thomas Dore; Stefan Guldin; Thomas S. Miller
주제: ellipsometry; spectroscopic ellipsometry; material science; operando ellipsometry
저자: Petra Demény; Borbála Tegze; Bálint Fodor; Pál Maák; János Madarász; Zsombor Pap; Dániel Zámbó; Tamás Igricz; Adél Sarolta Rácz; Norbert Nagy; Zoltán Hórvölgyi
주제: Oxides; Metal oxide nanoparticles; Nanoparticles; Coating materials; Semiconducting nanostructured materials
저자: Péter Márton; Simon Titkó; András Marton; Bálint Fodor; Péter Basa; Gergely Stankovits; Benjámin Gyarmati; János Rohonczy; Tamás Szabó; Dániel Zámbó; Zoltán Hórvölgyi
주제: Chitosan; Mesoporous silica reservoir; Bilayer nanocoating; Rhodamine 6G; Uptake and release
저자: Máté Füredi; András Marton; József Szenka; Boglárka Dikó; Emeric Balogh; Bálint Fodor; Thomas Siefke; Péter Basa
주제: Metrology; Porosimetry; Spectroscopy; Thin films; Nanomaterials; Geometrical optics; Surface and interface chemistry; Kelvin equation
저자: László Makai; Bálint Fodor; Péter Rutka; Péter Basa; Benjámin Kalas; Alekszej Romanenko; Péter Petrik
주제: Ellipsometers; ellipsometry; Interfaces; spectroscopic ellipsometry; Surface; Surface measurement
SE-1000 분광 타원편광법
