2013 • China SoG Silicon and PV Power Conference, June 2013, Suzhou, China

Technique for Monitoring of PID Susceptibility and Interface Trap Density in Advanced Passivation Dielectrics

Topic

passivation dielectricinterface trap densityPID susceptibility

M. Wilson, A. Findlay, J. Lagowski, J. D’Amico, A. Savtchouk

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