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Peer-reviewed papers featuring Semilab technology.
344 publications found
Author: Laszlo Makai, Csaba Balogh, Peter Basa, Jonas Haunschild
Topic: Ellipsometry; Photovoltaics; Monocrystalline textured; TOPCon
Author: Oleg Rusch, Julien Körfer, Boglárka Dikó, Zsófia Kiss, Attila Sütő, Emeric Balogh
Topic: trench MOSFET; OCD; critical dimension metrology; ellipsometry; reflectometry
Author: Zsombor Pap, Bálint Fodor, Julien Körfer, Mathias Rommel, László Makai
Topic: spectroscopic ellipsometry; thin oxide layer measurements; backside reflection; brewster’s angle
Author: D. Ullrich, J. Szivós, B. Dénes, Z. Deli, G. Fekete, Z. Bozóki, S. Lenk, Z. Zolnai, G. Nádudvari, L. Balogh
Topic: Annealing; Silicon; Measurement by laser beam; Laser excitation; Resistance; Temperature measurement; Crystals; Lasers; Electrical resistance measurement; Pump lasers
Author: Justin C. Bonner; Krisztián Bali; Bishal Bhandari; Tamás Tarjányi; Julia W.P. Hsu
Topic: PET; Durability; Adhesion; Transparent conducting electrode; Thermo-mechanical properties
Author: Petra Demény; Borbála Tegze; Bálint Fodor; Pál Maák; János Madarász; Zsombor Pap; Dániel Zámbó; Tamás Igricz; Adél Sarolta Rácz; Norbert Nagy; Zoltán Hórvölgyi
Topic: Oxides; Metal oxide nanoparticles; Nanoparticles; Coating materials; Semiconducting nanostructured materials
Author: Máté Füredi; András Marton; József Szenka; Boglárka Dikó; Emeric Balogh; Bálint Fodor; Thomas Siefke; Péter Basa
Topic: Metrology; Porosimetry; Spectroscopy; Thin films; Nanomaterials; Geometrical optics; Surface and interface chemistry; Kelvin equation
Author: László Makai; Bálint Fodor; Péter Rutka; Péter Basa; Benjámin Kalas; Alekszej Romanenko; Péter Petrik
Topic: Ellipsometers; ellipsometry; Interfaces; spectroscopic ellipsometry; Surface; Surface measurement
Author: Tamás Tarjányi, Csaba Rosztóczy, Ferenc Peták, Fruzsina Kun-Szabó, Gábor Gulyás, József Tolnai, Krisztián Bali, Petra Somogyi, Rebeka Anna Kiss, Gergely H. Fodor
Topic: nanoindentation; diabetes mellitus; rib bone; dynamic loading; aging; IND
Author: Tamás Tarjányi, Gábor Gulyás, Krisztián Bali, Márton Sámi, Rebeka Anna Kiss, Barbara Beiler, Péter Fürjes, Tibor Szabó
Topic: nanoindentation; hardness; creep; wafer; SU-8; epoxy
Author: Xian Xiao, Aimei Yang, Hanbin Zhang, Demian Park, Yangdong Wang, Balint Szabo, Edward S. Boyden, Kiryl D. Piatkevich
Topic: infrared; voltage measurement
Author: Baekmin Q. Kim, Zachariah Vicars, Máté Füredi, Lilia F. Escobedo, R. Bharath Venkatesh, Stefan Guldin, Amish J. Patel, Daeyeon Lee
Topic: ellipsometry; spectroscopic ellipsometry; spectroscopic ellipsometry; mapping; in-situ heating; vacuum chamber; NANO SURFACE CHARACTERIZATION
Author: D. Ullrich, Z. Bozóki, B. M. Kovács, Ö. Sepsi, F. Ujhelyi, Z. Zolnai, J. Szivós, G. Nádudvari, L. Balogh
Topic: Ion Implantation; Photomodulated Reflection measurements; Silicon (Si); silicon carbide (SiC); ION IMPLANT MONITORING
Author: Emőke Albert*; Péter Basa, Bálint Fodor; Zsófia Keresztes, János Madarász, Péter Márton, Dániel Olasz, Adél Sarolta Rácz, György Sáfrán, Tamás Szabó, Borbála Tegze, Tibor Höltzl, Zoltán Hórvölgyi
Topic: EP (ellipsometric porosimetry)
Author: R. J. Quinn1, Y. Go2, A.B. Naden 3, A. Bojtor, G. Paráda, A. K. M. A. Shawon 5, K. Domosud 6, K. Refson 6, A. Zevalkink 5, N. Neophytou 2, J. W. G. Bos 3
Topic: Hall effect
