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• Designed for R&D use: Materials science, semiconductor device research, advanced metrology
• Wide sample compatibility for various research applications
• Proven track record of Semilab AFM product family: Cited in multiple scientific publications
AFM-1000 Atomic Force Microscopy
Author: Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic: adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author: P.M. Nagy, D. Aranyi, P. Horváth, G. Pető, E. Kálmán
Topic: nanoindentation; Ion Implantation; mechanical properties; AFM
Author: Bálint Szentpéteri; Albin Márffy; Máté Kedves; Endre Tóvári; Bálint Fülöp; István Kükemezey; András Magyarkuti; Kenji Watanabe; Takashi Taniguchi; Szabolcs Csonka; Péter Makk
Topic: Pressure effects; Quantum Hall effect; Spin-orbit coupling; Weak antilocalization; Bilayer graphene; Graphene; Heterostructures; Transition metal dichalcogenides; Shubnikov-de
AFM-1000 Atomic Force Microscopy
