AFM-1000 Atomic Force Microscopy

•       AFM scanner utilizing flexure-guided piezo positioners for flat scanner movement

•       Configurable scan area size

•       Integrated dual focus camera system for laser alignment and tip-to-sample positioning

•       Compact tabletop AFM system with small footprint for R&D applications

•       Easy and safe sample and cantilever handling

•       Manually adjustable laser path

•       Motorized sample stage

•       Sample holder: clamps or magnetic fixing

•       High level of automation: series of different measurements can be automatically carried out on a single sample