FPP-1006 Four-Point Probe Measurement

Name: FPP-1006 Four-Point Probe Measurement
Brand: Semilab

FPP-1006 Four-Point Probe Measurement — Four-Point Probe Measurement

• Accurate sheet resistance measurement for thin film semiconductor, TCO, and metal layers

• Sample materials: Si, epitaxial layers, metal/implanted layers on Si

• Sheet resistance measurement of emitter layers in solar cells.

• Widely used in PV industry, thin film resistance measurements, and R&D

• Industry standard 6-point probe method with Semilab reliability and support

FPP-1006 Four-Point Probe Measurement

Author: M. Bail, J. Kentsch, R. Brendel, M. Schulz

Topic: carrier lifetime; infrared camera

FPP-1006 Four-Point Probe Measurement