AFM-2000 原子力显微镜

Name: AFM-2000 原子力显微镜
Brand: Semilab

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AFM-2000 原子力显微镜 — 原子力显微镜

AFM-2000 原子力显微镜

Ballistic Electron Emission Microscopy of Schottky Diodes on RF-Plasma-Treated Silicon

作者: L. Quattropani, K. Solt, P. Niedermann, I. Maggio-Aprile, O. Fischer, T. Pavelka

主题: Schottky diode; RF plasma treated silicon

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Elsevier, Colloids and Surfaces B: Biointerfaces2024

Breast adenocarcinoma cells adhere stronger to brain pericytes than to endothelial cells

作者: Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh

主题: adhesion assay; Zeiss AFM; single-cell force spectroscopy

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Int. Conference on Defects Recognition, Imaging and Physics in Semiconductors, Warsaw, Poland 20132013

Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces

作者: D. Marinskiy, P. Edelman, A.D. Snider

主题: Kelvin force microscopy; corona charge; concentration profile; surface diffusion

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Meeting Abstracts - The Electrochemical Society2017

Kelvin Force Probe Microscopy of Ferroelectric Si: HfO2

作者: Dmitriy Marinskiy, Patrick Polakowski, Jacek Lagowski, Marshall Wilson, Piotr Edelman, Johannes Müller

主题: corona - Kelvin; Non-Contact Measurement; THIN FILM CHARACTERIZATION

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Surface and Interface Analysis, Vol. 40, Issue 3-4, p 875-880, 10 March, 20082008

Nanomechanical Properties of Ion-Implanted Si

作者: P.M. Nagy, D. Aranyi, P. Horváth, G. Pető, E. Kálmán

主题: nanoindentation; Ion Implantation; mechanical properties; AFM

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Physical Review B2025

Increasing the proximity-induced spin-orbit coupling in bilayer graphene/WSe2 heterostructures with pressure

作者: Bálint Szentpéteri; Albin Márffy; Máté Kedves; Endre Tóvári; Bálint Fülöp; István Kükemezey; András Magyarkuti; Kenji Watanabe; Takashi Taniguchi; Szabolcs Csonka; Péter Makk

主题: Pressure effects; Quantum Hall effect; Spin-orbit coupling; Weak antilocalization; Bilayer graphene; Graphene; Heterostructures; Transition metal dichalcogenides; Shubnikov-de

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AFM-2000 原子力显微镜

Tailored Surface Characterization Tools for R&D

2025年9月17日

AFM-2000 原子力显微镜

AFM-2000 原子力显微镜 — 原子力显微镜

相关文献

Ballistic Electron Emission Microscopy of Schottky Diodes on RF-Plasma-Treated Silicon

Breast adenocarcinoma cells adhere stronger to brain pericytes than to endothelial cells

Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces

Kelvin Force Probe Microscopy of Ferroelectric Si: HfO2

Nanomechanical Properties of Ion-Implanted Si

Increasing the proximity-induced spin-orbit coupling in bilayer graphene/WSe2 heterostructures with pressure

相关白皮书

Tailored Surface Characterization Tools for R&D

Pushing Size Limits in the Semiconductor Industry and Metrology

AFM-2000 原子力显微镜

AFM-2000 原子力显微镜 — 原子力显微镜

相关文献

Ballistic Electron Emission Microscopy of Schottky Diodes on RF-Plasma-Treated Silicon

Breast adenocarcinoma cells adhere stronger to brain pericytes than to endothelial cells

Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces

Kelvin Force Probe Microscopy of Ferroelectric Si: HfO2

Nanomechanical Properties of Ion-Implanted Si

Increasing the proximity-induced spin-orbit coupling in bilayer graphene/WSe2 heterostructures with pressure

相关白皮书

Tailored Surface Characterization Tools for R&D

Pushing Size Limits in the Semiconductor Industry and Metrology